The vulnerability of PERC modules to LID and LeTID is well known and among the reasons the industry is moving towards N-type technology, which tends to be less affected by the two phenomena. TUV Nord ...

UV degradation was among the three most common test failures from Kiwa PVEL’s module testing this year. Image: Kiwa PVEL. As the year comes to a close, there is no doubt that this was the year of ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

Ever since the earliest semiconductor devices, silicon health has been a concern. Systems manufacturers wanted to be sure that their chips worked properly before being soldered onto printed circuit ...

STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...