Tech Xplore on MSN

Researchers solve longstanding problem in measuring semiconductor defects

Researchers at Sandia National Laboratories and Auburn University have developed a new method to more accurately detect ...
Electronics For You

Semiconductor Defect Detection Advancement

Researchers have developed a physics-based technique that accurately measures atomic-scale semiconductor defects, helping ...
mccormick.northwestern.edu

Razeghi Named Conference Chair of Workshop on Defects in Wide Band Gap Semiconductors

Manijeh Razeghi, Walter P. Murphy Professor has been named Conference Chair of the Workshop on Defects in Wide Band Gap Semiconductors (WBG), which will be held on Monday, September 23, 2014 at the ...
Compound Semiconductor

A new way to measure WBG device defects

Researchers at Sandia National Laboratories and Auburn University in the US have developed a new method to more accurately ...
Nanowerk

Defect-engineered zinc oxide turns tiny strain into near-infrared light

Defect-engineered zinc oxide converts tiny reversible strains into near-infrared light, opening a rare-earth-free path to ...
Semiconductor Engineering

Hunting For Macro Defects

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...