AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Machine learning (ML) is reshaping pipeline integrity management (PIM) from physics-based to data-driven paradigms. This ...

Advanced process control: TSMC is using the NVIDIA cuML machine learning library to accelerate large-scale analytics on NVIDIA GPUs. This lets TSMC speed algorithms and distill hundreds of thousands ...

The chip equipment maker is working with NUS and SIT to speed process development and train engineers for automated ...

Artificial Intelligence is no longer a futuristic concept: it is a present-day force reshaping industries. From healthcare to ...

Deeply's 'Listen AI Industrial' has already proven to have 99.87% accuracy in global automaker (Company H) production lines ...

The collaboration connects research lab optimisation with talent pipeline for industry needs. The National University of ...

Soldier systems operating at the tactical edge are failing not because they lack advanced sensors or autonomy, but because ...

A machine learning model developed by researchers at the Johns Hopkins Kimmel Cancer Center filters out the biological noise ...

A material may appear flawless on the surface yet fail to function properly. The cause lies in structural defects hidden ...

Wind shear, a sudden change in wind speed or direction, is a major cause of aviation incidents; it was responsible for 18% of ...

Neutrino experiments are entering an era of unprecedented detector scale, precision, and data complexity. From liquid argon time projection chambers and ...