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AI Visual Inspection For Defect Detection in Manufacturing

Verisurf Metrology Education Software

Japan | KLA

Announcing our new 8930 high productivity patterned wafer defect inspection system! To support key inspection needs for the IoT, 5G and automotive IC segments, the 8930 quickly and reliably finds and identifies critical defects, supporting a variety of applications where process issue resolution requires high-speed and high-sampling inspection. Learn more: https://www.kla-tencor.com/products/chip-manufacturing/defect-inspection-review#product-8-series | KLA Corporation

Meet our eSL10™ e-beam patterned wafer defect inspection system! With multiple revolutionary e-beam technologies, the eSL10 captures many types of defects across a range of process layers and device architectures, helping accelerate time to market for high-performance logic and memory chips. Learn more at: https://www.kla.com/esl10-ebeam-inspection | KLA Corporation